National Centre for Nano-structured Materials (NCNSM)

Scanning Probe

Instrument:

Atomic Force Microscope

Make and model etc.:

Digital instruments Nanoscope, Veeco, MMAFMLN-AM (Multimode)

Room number:

A014

Responsible person/s:

Thomas Malwela/Gebhu Ndlovu/Thembela Hillie

Operator required?

Yes

Specifications:

AFM provides atomic resolution images of both conducting and non-conducting surfaces in 3D using a sharp tip attached at far end of the cantilever. The maximum scan area is 120µm x 120µm and the maximum sample roughness should be less than 7µm.

It has three modes which are employed for imaging: Contact Mode, Tapping Mode and Non-Contact Mode

It can image the morphology, measure the roughness and particle size.
Sample Stage
Maximum Sample Size: 1x1cm,
Maximum Sample Height: 3mm