National Centre for Nano-structured Materials (NCNSM)

Scanning Probe

Instrument:

Scanning Tunnelling Microscope

Make and model etc.:

Omicron VT UHV SPM (Variable Temperature)

Room number:

A014

Responsible person/s:

Gebhu Ndlovu/Thomas Malwela

Operator required?

Yea

Specifications:

The VT STM system combines the power of scanning tunneling microscopy (STM) which allows observations at nanometer scale of conducting and semiconducting surfaces with the capability to control sample temperature (25 K - 1500 K) in an ultrahigh vacuum (UHV) environment. The systems internal spring suspension mechanism with eddy current damping ensures excellent vibration isolation, thus high-resolution SPM. The bolt-on chamber houses a sample carousel for up to 6 samples/tips. A wobble stick for quick and reliable samples transfer.
Measurements

• STM (topography, surface electronic structure)
• Auger
• LEED(Low energy electron diffraction)
• Ion sputter gun for sputtering