| Instrument: |
New charge CSIR and academia |
New charge industry |
| OPTICAL: |
|
|
| Photoluminescence Spectrometer |
R150/sample |
R225/sample |
| Nanolog Spectro-Fluorometer |
R250/sample |
R375/sample |
| Nanoparticle size analyzer |
R150/sample |
R225/sample |
| Raman Spectrometer |
The greater of R250/sample or R800/hour. Standard excitation at 514nm. A change of wavelength will be charged at R500 per change |
The greater of R375/sample or R1200/hour. A change of wavelength will be charged at R750 per change. |
| Fourier Transform Infrared Spectroscopy (FTIR) |
R150/sample |
R225/sample |
| Automated Angel Ellipsometer |
R100/sample |
R150/sample |
| UV/VIS Spectrometer |
R150/sample |
R225/sample |
| |
|
|
| SCANNING PROBE: |
|
|
| Scanning Tunnelling Microscope |
R500/hour |
R750/hour |
| Atomic Force Microscope |
R500/hour |
R750/hour |
| |
|
|
| IMAGE FORMING: |
|
|
| Polarised Optical Microscope |
R150/sample. If conditions such as temperature are changed, then the cost of another sample will be added. |
R225/sample. If conditions such as temperature are changed, then the cost of another sample will be added. |
| Scanning Electron Microscope |
R400/hour |
R600/hour |
| Transmission Electron Microscope |
R400/hour |
R600/hour |
| |
|
|
| X-RAY: |
|
|
| Small and wide angle X-ray scattering |
R200/sample without data interpretation and at room temperature. Interpretation will be charged at operator rate. |
R300/sample without data interpretation and at room temperature. Interpretation will be charged at operator rate. |
| Xray Diffraction |
R150/sample without data interpretation. Interpretation will be charged at operator rate. If the exposure time is more than 20 min, then R400/hour. |
R225/sample without data interpretation. Interpretation will be charged at operator rate. If the exposure time is more than 20 min, then R600/hour. |
| |
|
|
| POLYMER: |
|
|
| Twin Screw Extruder |
R300/hour |
R450/hour |
| Micro-injection Moulder |
R300/hour |
R450/hour |
| Rheomixer |
R300/hour |
R450/hour |
| Hot Press |
R100/hour |
R150/hour |
| Differential Scanning Calorimeter |
R150/sample |
R225/hour |
| Thermo Gravimetric Analyser |
R150/sample |
R225/hour |
| Dynamic Mechanic Analyser |
R300/hour without LN |
R450/hour without LN |
| Rheometer |
R300/hour |
R450/hour |
| Heat Distortion Temperature Tester |
R200/hour |
R300/hour |
| Notching Machine |
R200/hour |
R300/hour |
| Impact Tester |
R100/sample |
R150/sample |
| Tensile Tester |
R100/sample |
R150/sample |
| |
|
|
| ELECTRICAL: |
|
|
| Four point probe semi-conductor characterisation |
R150/sample |
R225/sample |
| Ultramicrotome |
R500/hour |
R750/hour |
